An assessment of automated extraction capabilities for small-signal modeling of various GaAs pHEMT processes

Статья в сборнике трудов конференции

A new automated small-signal GaAs pHEMT model extraction technique based on the analytical approach followed by optimization is suggested. The performance capability of the technique is confirmed by successful small-signal modeling of pHEMTs manufactured by different semiconductor fabs.

Библиографическая запись: An assessment of automated extraction capabilities for small-signal modeling of various GaAs pHEMT processes / A. Popov [et. al.] // ITM Web of Conferences. – 2019. – Vol. 30. – P. 01001. – DOI: 10.1051/itmconf/20193001001

Ключевые слова:

SMALL-SIGNAL MODEL GAAS PHEMT AUTOMATED EXTRACTION TECHNIQUE GAAS PHEMT PROCESS

Конференция:

29th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
Россия, Крым, Севастополь, 8-14 сентября 2019,
Международная

Издательство:

EDP Sciences

Франция, Région Île-de-France, Les Ulis

Авторы: Попов А. А., Билевич Д. В., Сальников А. С., Добуш И. М., Горяинов А. Е., Калентьев А. А.

Год издания: 2019

Страницы: 1 - 5

Язык: Английский

DOI: 10.1051/itmconf/20193001001

Индексируется в Web of science