A study of connectors and feed lines de-embedding techniques for PCB microwave components S-parameters measurements up to 50 GHz

Статья в сборнике трудов конференции

Connectors and lines de-embedding techniques for PCB microwave components S-parameters measurements up to 50 are considered. Comparison between widely used Multiline Thru-Reflect-Line (MTRL) method and promising 2xThru method are presented. This paper has demonstrated that both methods give same results, however, 2xThru method requires just one measured structure as opposite MTRL, where six measured structures are used. The difference between obtained and measured parameters of device under test are less than 0.35 dB in magnitude and 1.5° in phase for insertion loss, and less than 0.08 in magnitude and 10° in phase for return loss at most frequency points.

Библиографическая запись: A study of connectors and feed lines de-embedding techniques for PCB microwave components S-parameters measurements up to 50 GHz [Electronic resource] / A. S. Salnikov [et. al.] // Dynamics of Systems, Mechanisms and Machines: XIV International scientific and technical conference (10–12 November 2020, Omsk, Russia) : Conference Paper. – Omsk : IEEE, 2020. – P. 9306169. – DOI: 10.1109/Dynamics50954.2020.9306169

Ключевые слова:

2XTHRU BEATTY STANDART DE-EMBEDDING MULTILINE TRL PCB TEST FIXTURE TIME DOMAIN

Конференция:

Dynamics of Systems, Mechanisms and Machines: XIV International scientific and technical conference
Russia, Омская область, Омск, 10-12 ноября 2020,
Международная

Издательство:

IEEE

Russia, Омская область, Омск

Авторы: Сальников А. С., Добуш И. М., Билевич Д. В., Попов А. А., Калентьев А. А., Горяинов А. Е.

Год издания: 2020

Страницы: 1 - 6

Язык: Английский

DOI: 10.1109/Dynamics50954.2020.9306169

Индексируется в Scopus, РИНЦ