Estimating the insertion attenuation under different methods of modal redundancy in differential and common modes

Статья в сборнике трудов конференции

This paper investigates the dependence of the insertion attenuation in two configurations of the conductor arrangement before and after switching. The first configuration implies that the electrical characteristics of the structure used to provide modal redundancy are not the same. The second configuration implies that the electrical characteristics of this structure before and after switching are the same. The use of the first option allows taking into account and compensating for the predictable changes in the characteristics of radio-electronic equipment, as the radio elements degrade or age. Knowing the characteristics of conductor switching methods allows designers to determine where it is necessary to take into account the changing characteristics before and after switching, as well as to determine the most optimal switching in terms of noise attenuation in differential and common modes. For configuration #1, the insertion attenuation before switching was minus 14.8 dB in both modes, and after switching it was minus 11.8 dB and minus 13 dB in differential and common modes, respectively. For configuration #2, before and after switching, the insertion attenuation was minus 14.6 dB and minus 15 dB in differential and common modes, respectively.

Библиографическая запись: Lakoza, A. M. Estimating the Insertion Attenuation under Different Methods of Modal Redundancy in Differential and Common Modes [Electronic resource] / A. M. Lakoza, V. P. Kosteletskii, A. M. Zabolotsky // Proceedings 2023 International Ural Conference on Electrical Power Engineering (UralCon) (Magnitogorsk, Russian Federation, 29 September 2023 - 01 October 2023). – New York City : IEEE, 2023. – P. 408-412. – DOI: 10.1109/UralCon59258.2023.10291125

Конференция:

• 2023 International Ural Conference on Electrical Power Engineering (UralCon)
• Россия, Челябинская область, Магнитогорск, 29 сентября-01 октября 2023,
• Международная

Издательство:

IEEE

США, New York, New York City