Approach to estimation of radiated emission from circuits with modal reservation

Статья в сборнике трудов конференции

Proceeding from the increasing importance of radioelectronic devices, and with an intuitive result, an increased interest in studying and ensuring the electromagnetic compatibility of these devices and especially the critical radioelectronic equipment and systems, a new approach had been applied with a name of “modal reservation In order to investigate the possible options for different arrangements of circuits with reservation, a lot of research work has to be done on those arrangements taking into account so many criteria and factors including the radiation pattern among them. For analysing printed circuit interconnects, the quasi-static approach has an obvious advantage, since the circuit analysis does not always allow obtaining the results of sufficient accuracy, and the electrodynamic one requires significant computational costs. Combining these approaches is proposed, using the calculated results of the current and voltage in multiconductor transmission lines structure from the quasi-static approach, in the electrodynamic analysis to calculate the far-zone field components for the radiation pattern from this structure. The novelty of the estimations obtained is determined by the concept of combining the studied approaches in order to get accurate result, and the fact that they have never been performed for circuits with modal reservation in such a complex form. This paper aims at developing a mathematical model and algorithm which allow calculating the field strength from a circuit with modal reservation using currents in circuit conductors obtained by quasi-static analysis. The algorithm implementation showed acceptable coincidence of current distribution and radiation pattern obtained from a simple test structure by the proposed algorithm and electrodynamic analysis.

Библиографическая запись: Alhaj Hasan, A. Approach to Estimation of Radiated Emission from Circuits with Modal Reservation [Electronic resource] / A. Alhaj Hasan, A. A. Kvasnikov, T. R. Gazizov // 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) (Chemal, Russia, 29 June 2020 - 03 July 2020). – New York City : IEEE, 2020. – P. 169-173. – DOI: 10.1109/EDM49804.2020.9153498

Конференция:

• 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)
• Россия, Республика Алтай, Чемал, 29 июня-03 июля 2020,
• Международная

Издательство:

IEEE

США, New York, New York City